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	<title>85130D &#8211; Erik Prayoga</title>
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		<title>Keysight 85130D Test Port Adapter Set: Precision Connectivity for High-Frequency Applications</title>
		<link>https://erik-prayoga.com/product/keysight-85130d-test-port-adapter-set-precision-connectivity-for-high-frequency-applications/</link>
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		<dc:creator><![CDATA[Erik Prayoga]]></dc:creator>
		<pubDate>Tue, 23 Jun 2026 04:46:42 +0000</pubDate>
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					<description><![CDATA[Keysight 85130D Test Port Adapter Set: 3.5mm M/F, DC-26.5GHz, 28dB Return Loss, for precise signal analysis and testing in high-frequency applications.]]></description>
										<content:encoded><![CDATA[<p><strong>Keysight 85130D Test Port Adapter Set</strong></p>
<p><strong>Product Overview:</strong></p>
<p>The Keysight 85130D Test Port Adapter Set is a high-performance adapter set designed for use in microwave and millimeter-wave applications. It provides a convenient and reliable way to connect test equipment to devices under test (DUTs) with 3.5 mm connectors.</p>
<p><strong>Features and Specifications:</strong></p>
<p><em> Frequency range: DC to 26.5 GHz<br /></em> Return loss: 28 dB (typical)<br /><em> Insertion loss: 0.5 dB (typical)<br /></em> VSWR: 1.15:1 (typical)<br /><em> Connector type: 3.5 mm male/female<br /></em> Number of adapters: 2</p>
<p><strong>Benefits:</strong></p>
<p><em> <strong>High performance:</strong> Provides accurate and reliable measurements with minimal signal loss and distortion.<br /></em> <strong>Wide frequency range:</strong> Covers a wide range of applications, from DC to millimeter-wave frequencies.<br /><em> <strong>Easy to use:</strong> Quick and convenient to connect and disconnect, reducing setup time.<br /></em> <strong>Durable construction:</strong> Built to withstand repeated use in demanding environments.</p>
<p><strong>Value to the Customer:</strong></p>
<p>The Keysight 85130D Test Port Adapter Set offers exceptional value to customers by:</p>
<p><em> <strong>Improving measurement accuracy:</strong> Ensures reliable and repeatable measurements by minimizing signal loss and distortion.<br /></em> <strong>Expanding application range:</strong> Enables testing of devices across a wide frequency range, from DC to millimeter-wave frequencies.<br /><em> <strong>Saving time and effort:</strong> Reduces setup time and simplifies testing procedures.<br /></em> <strong>Ensuring durability:</strong> Provides long-lasting performance in demanding environments.</p>
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